Seminar: Measuring Complex Materials and Components

16th July 2013, Winnersh, UK

Join Agilent at this complimentary full day seminar with guest speakers from University of Cambridge and Thomas Keating.

The event will cover the fundamentals of impedance measurements, techniques of characterising complex materials and how to measure material/component properties in nano-scale resolution. It will conclude with a session focused on emerging novel material research challenges.

For more information and to register, click on the link below.

Agilent Technologies

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